Tektronix P6246 Oscilloscope Probe, Differential Type, 400MHz, X1, X10, BNC Connector
Τεχνικό φυλλάδιο
Προδιαγραφές
Brand
TektronixProbe Type
Differential
Attenuation
X1, X10
Bandwidth
400MHz
Maximum Common Mode Input Voltage
±7 (1X & 10X)V
Connector Type
BNC
Model Number p
P6246
Number of Probes
1
Rise Time
875ps
Χώρα Προέλευσης
China
Λεπτομέρειες Προϊόντος
Tektronix Differential Probes P6246, P6247, P6248
Tektronix differential probes P6246, P6247 & P6248 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in disk drive, digital IC design (RAMBUS) and communication applications (Gigabit Ethernet, IEEE-1394 Firewire and Fibre Channel). The P6248 comes with accessories that allow RAMBUS via probing and IEEE-1394 interconnect access. All the probes have a small probe head geometry. They are supplied with probe tip accessories to accommodate manual probing of surface mount devices while maintaining high CMRR. They are popular choices for design verification of disk drive read channel electronics and timing analysis for troubleshooting ground bounce problems associated with high speed logic. Additional applications include pulse shape or cross talk compliance testing of high speed communication signals.
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P.O.A.
1
P.O.A.
1
Τεχνικό φυλλάδιο
Προδιαγραφές
Brand
TektronixProbe Type
Differential
Attenuation
X1, X10
Bandwidth
400MHz
Maximum Common Mode Input Voltage
±7 (1X & 10X)V
Connector Type
BNC
Model Number p
P6246
Number of Probes
1
Rise Time
875ps
Χώρα Προέλευσης
China
Λεπτομέρειες Προϊόντος
Tektronix Differential Probes P6246, P6247, P6248
Tektronix differential probes P6246, P6247 & P6248 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in disk drive, digital IC design (RAMBUS) and communication applications (Gigabit Ethernet, IEEE-1394 Firewire and Fibre Channel). The P6248 comes with accessories that allow RAMBUS via probing and IEEE-1394 interconnect access. All the probes have a small probe head geometry. They are supplied with probe tip accessories to accommodate manual probing of surface mount devices while maintaining high CMRR. They are popular choices for design verification of disk drive read channel electronics and timing analysis for troubleshooting ground bounce problems associated with high speed logic. Additional applications include pulse shape or cross talk compliance testing of high speed communication signals.