Panasonic Through Beam Photoelectric Sensor, Block Sensor, 150 mm Detection Range

Κωδικός Προϊόντος της RS: 431-1900Κατασκευαστής: PanasonicΚωδικός Κατασκευαστή: EX-11EA-PN
brand-logo
View all in Photoelectric Sensors

Τεχνικό φυλλάδιο

Προδιαγραφές

Sensor Style

Block

Detection Type

Through Beam

Detection Range

150 mm

Output Type

PNP

Electrical Connection

Cable

Maximum dc Voltage

24V

Light Source

LED

IP Rating

IP67

Maximum Current

50 mA

Response Time

<500 μs

Minimum Operating Temperature

-25°C

Series

EX10

Housing Material

PET

Maximum Operating Temperature

+55°C

Λεπτομέρειες Προϊόντος

EX10 — Optosensor, Subminiature

EX-10 series amplifier built-in ultra-slim photoelectric sensors with flexible mounting for many applications such as positioning of PCBs, detecting ICs, detecting PCB racks, detecting wafer cassettes, detecting thin rings or checking for absence of capacitor in tray.

Ημερομηνία αποθέματος προσωρινά μη διαθέσιμη

Παρακαλούμε ελέγξτε ξανά αργότερα.

Ημερομηνία αποθέματος προσωρινά μη διαθέσιμη

€ 231,64

Μονάδας (Exc. Vat)Χωρίς Φ.Π.Α

€ 287,23

Μονάδας (Including VAT) Με Φ.Π.Α

Panasonic Through Beam Photoelectric Sensor, Block Sensor, 150 mm Detection Range

€ 231,64

Μονάδας (Exc. Vat)Χωρίς Φ.Π.Α

€ 287,23

Μονάδας (Including VAT) Με Φ.Π.Α

Panasonic Through Beam Photoelectric Sensor, Block Sensor, 150 mm Detection Range
Ημερομηνία αποθέματος προσωρινά μη διαθέσιμη

Τεχνικό φυλλάδιο

Προδιαγραφές

Sensor Style

Block

Detection Type

Through Beam

Detection Range

150 mm

Output Type

PNP

Electrical Connection

Cable

Maximum dc Voltage

24V

Light Source

LED

IP Rating

IP67

Maximum Current

50 mA

Response Time

<500 μs

Minimum Operating Temperature

-25°C

Series

EX10

Housing Material

PET

Maximum Operating Temperature

+55°C

Λεπτομέρειες Προϊόντος

EX10 — Optosensor, Subminiature

EX-10 series amplifier built-in ultra-slim photoelectric sensors with flexible mounting for many applications such as positioning of PCBs, detecting ICs, detecting PCB racks, detecting wafer cassettes, detecting thin rings or checking for absence of capacitor in tray.