Texas Instruments SCANSTA111MT/NOPB, 7-Bit Addressable Scan Port, 3 → 3.6 V, 48-Pin TSSOP
Τεχνικό φυλλάδιο
Προδιαγραφές
Brand
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Mounting Type
Surface Mount
Package Type
TSSOP
Pin Count
48
Dimensions
12.6 x 6.2 x 1.05mm
Length
12.6mm
Width
6.2mm
Height
1.05mm
Maximum Operating Supply Voltage
3.6 V
Maximum Operating Temperature
+85 °C
Minimum Operating Supply Voltage
3 V
Minimum Operating Temperature
-40 °C
Operating Temperature Range
-40 → +85 °C
Operating Supply Voltage Range
3 → 3.6 V
Λεπτομέρειες Προϊόντος
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.
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P.O.A.
1
P.O.A.
1
Ideate. Create. Collaborate
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Τεχνικό φυλλάδιο
Προδιαγραφές
Brand
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Mounting Type
Surface Mount
Package Type
TSSOP
Pin Count
48
Dimensions
12.6 x 6.2 x 1.05mm
Length
12.6mm
Width
6.2mm
Height
1.05mm
Maximum Operating Supply Voltage
3.6 V
Maximum Operating Temperature
+85 °C
Minimum Operating Supply Voltage
3 V
Minimum Operating Temperature
-40 °C
Operating Temperature Range
-40 → +85 °C
Operating Supply Voltage Range
3 → 3.6 V
Λεπτομέρειες Προϊόντος
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.
Ideate. Create. Collaborate
JOIN FOR FREE
No hidden fees!
- Download and use our DesignSpark software for your PCB and 3D Mechanical designs
- View and contribute website content and forums
- Download 3D Models, Schematics and Footprints from more than a million products